Probing the conducting paths in a metal - insulator composite by conducting atomic force microscopy
- 14 December 1996
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 29 (12) , 3169-3172
- https://doi.org/10.1088/0022-3727/29/12/036
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Total-energy study of hydrogen ordering in(0⩽x⩽1)Physical Review B, 1996
- Direct Imaging of the Percolation Network in a Three-Dimensional Disordered Conductor-Insulator CompositePhysical Review Letters, 1995
- Giant Hall effect in percolating ferromagnetic granular metal-insulator filmsApplied Physics Letters, 1995
- Characterization of a point-contact on silicon using force microscopy-supported resistance measurementsApplied Physics Letters, 1995
- Delineation of semiconductor doping by scanning resistance microscopyApplied Physics Letters, 1994