Critical behaviour of the electrical resistivity near the Neel point in antiferromagnetic Cr-Mn alloys

Abstract
Direct measurements of the temperature derivative of the electrical resistivity (dp/dT) have been used to study the antiferro-paramagnetic transition in Cr-Mn alloys with high Mn content (58, 64%). Rather precise estimates of the Neel points (TN) were possible, the difference between TN and the minimum in the electrical resistivity (Tmin) being clearly established. Estimates of the critical exponents lambda and the Neel points are discussed in comparison with other available data.