High resolution electrical characterisation of organic photovoltaic blends
- 1 March 2007
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 84 (3) , 431-436
- https://doi.org/10.1016/j.mee.2006.10.056
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Tuning the Dimensions of C60-Based Needlelike Crystals in Blended Thin FilmsAdvanced Functional Materials, 2006
- Thermally Stable, Efficient Polymer Solar Cells with Nanoscale Control of the Interpenetrating Network MorphologyAdvanced Functional Materials, 2005
- Kelvin Probe Force Microscopy Study of Conjugated Polymer/Fullerene Organic Solar CellsJapanese Journal of Applied Physics, 2005
- Effect of LiF/metal electrodes on the performance of plastic solar cellsApplied Physics Letters, 2002
- Oxide thickness mapping of ultrathin Al2O3 at nanometer scale with conducting atomic force microscopyApplied Physics Letters, 2001
- Another dimension in device characterizationIEEE Circuits and Devices Magazine, 2000
- Comparison of two-dimensional carrier profiles in metal–oxide– semiconductor field-effect transistor structures obtained with scanning spreading resistance microscopy and inverse modelingJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000
- AFM Fabrication of Sub-10-Nanometer Metal-Oxide Devices with in Situ Control of Electrical PropertiesScience, 1995
- Selective area oxidation of silicon with a scanning force microscopeApplied Physics Letters, 1993
- Kelvin probe force microscopyApplied Physics Letters, 1991