Limited Angle Diffraction Tomography and Its Application to Planar Scanning Systems
- 1 January 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Sonics and Ultrasonics
- Vol. 32 (1) , 9-16
- https://doi.org/10.1109/T-SU.1985.31564
Abstract
No abstract availableKeywords
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