Use of a fast atom beam in ion microscopy (FABIM) for analysis of poorly conducting materials
- 1 August 1985
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 7 (4) , 177-187
- https://doi.org/10.1002/sia.740070405
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Secondary-Ion Mass-Spectrometry on insulators with neutral primary particlesMicrochimica Acta, 1981
- Use of the IMS-3f High Mass Resolving PowerPublished by Springer Nature ,1979