Steady state thermal analysis and high-power reliability considerations of RF MEMS capacitive switches
- 25 June 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Lifetime characterization of capacitive RF MEMS switchesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- MEMS devices for high isolation switching and tunable filteringPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- High-isolation W-band MEMS switchesIEEE Microwave and Wireless Components Letters, 2001
- 2-bit MEMS distributed X-band phase shiftersIEEE Microwave and Guided Wave Letters, 2000
- High-isolation CPW MEMS shunt switches. 2. DesignIEEE Transactions on Microwave Theory and Techniques, 2000
- Ka-band RF MEMS phase shiftersIEEE Microwave and Guided Wave Letters, 1999
- Performance of low-loss RF MEMS capacitive switchesIEEE Microwave and Guided Wave Letters, 1998