Inelastic helium scattering measurements of surface phonons in hydrogen-terminated Si(111) (1 × 1)
- 31 December 1990
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 54-55, 291-298
- https://doi.org/10.1016/0368-2048(90)80221-u
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Coupling of an adsorbate vibration to a substrate surface phonon: H on Si(111)Physical Review Letters, 1990
- Phonons in a surface with a mass defect: As:Si(111)(1×1)Physical Review B, 1990
- Structure and dynamics of strong chemisorption on Si(111) as measured with atomic helium scatteringJournal of Vacuum Science & Technology B, 1989
- Surface phonons on Si(111) in comparison to EELS experimentsPhysics Letters A, 1988
- Surface phonons in Si(111) + H(1×1)Physical Review B, 1988
- Surface phonon calculation for Si(111): H(1×1)Physica Scripta, 1988
- Frequency shift and attenuation length of a Rayleigh wave due to surface roughnessPhysical Review B, 1983