High crystalline quality erbium silicide films on (100) silicon, grown in high vacuum
- 1 August 1996
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 102, 151-155
- https://doi.org/10.1016/0169-4332(96)00036-0
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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