Study of SEUs generated by high energy ions
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (3) , 601-606
- https://doi.org/10.1109/23.299806
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Investigation of single event effects of high energetic heavy ionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Heavy ion microscopy of single event upsets in CMOS SRAMsIEEE Transactions on Nuclear Science, 1994
- Measurement of SEU Thresholds and Cross Sections at Fixed Incidence AnglesIEEE Transactions on Nuclear Science, 1987
- An automatic measuring system for particle tracks in plastic detectorsNuclear Instruments and Methods in Physics Research, 1984
- Single Event Upset Testing with Relativistic Heavy IonsIEEE Transactions on Nuclear Science, 1984