Heavy ion microscopy of single event upsets in CMOS SRAMs
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (3) , 589-592
- https://doi.org/10.1109/23.299804
Abstract
The single event upset (SEU) imaging has been applied at the GSI heavy ion microprobe to determine the sensitivity of integrated circuits (IC) to heavy ion irradiation. This method offers the possibilty to directly image those parts of an IC which are sensitive to ion-induced malfunctions. By a 3-dimensional simulation of charge collection across p-n-micro-junctions we can predict SEU cross-sections. For a MHS65 162 2k x 8bit CMOS SRAM we found two regions per bit with different sensitivity and measured a total cross-section of (71 +/- 18)µm² for a bitflip per cell and simulated 60µm² with an argon beam of 1.4 Mev/nucl. (LET of 19.7 MeV/mg/cm²)Keywords
This publication has 10 references indexed in Scilit:
- Investigation of single event effects of high energetic heavy ionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Single event upset imaging with a nuclear muprobeNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- mubeam system for study of single event upset of semiconductor devicesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- Nuclear microprobe imaging of single-event upsetsIEEE Transactions on Nuclear Science, 1992
- HalbleiterphysikPublished by Springer Nature ,1992
- Modeling charge collection and single event upsets in microelectronicsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Single-particle techniquesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Range and stopping-power tables for 2.5–500 MeV/nucleon heavy ions in solidsAtomic Data and Nuclear Data Tables, 1990
- The heavy-ion microprobe at GSI — Used for single ion micromechanicsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- The scanning heavy ion microscope at GSINuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985