Observation of theDielectronic Recombination Process in Highly Stripped Argon Ions
- 20 February 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 52 (8) , 617-620
- https://doi.org/10.1103/physrevlett.52.617
Abstract
A novel technique for studying the dielectronic recombination process is presented. The interaction of very highly stripped trapped ions with a tunable energy electron beam is studied using an electron-beam ion source. Dielectric recombination resonances have been observed in for single configurations ( resonances). The generality of this method which makes possible the selective study of electron-ion interactions of plasma diagnostic interest is discussed.
Keywords
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