Electrical measurements of boron implanted silicon on sapphire and bulk silicon
- 1 January 1980
- journal article
- Published by Taylor & Francis in Radiation Effects
- Vol. 49 (1-3) , 7-12
- https://doi.org/10.1080/00337578008243058
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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