Highly sensitive Moire technique for direct and real-time observation of electron microscopic phase objects
- 8 June 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (23) , 2840-2842
- https://doi.org/10.1063/1.106841
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Digital extraction of the magnetic-flux distribution from an electron interferogramJournal of the Optical Society of America A, 1991
- Computer reconstruction from electron holograms and observation of fluxon dynamicsPhysical Review Letters, 1991
- Magnetic field observation of a single flux quantum by electron-holographic interferometryPhysical Review Letters, 1989
- Mapping of microelectric and magnetic fields with double-exposure electron holographyApplied Physics Letters, 1988
- Applications of electron holographyReviews of Modern Physics, 1987
- Electron Holographic Observations of the Electrostatic Field Associated with Thin Reverse-BiasedJunctionsPhysical Review Letters, 1985
- Computer-based highly sensitive electron-wave interferometryApplied Optics, 1985
- Observation of recorded magnetization pattern by electron holographyApplied Physics Letters, 1983
- Observation of Aharonov-Bohm Effect by Electron HolographyPhysical Review Letters, 1982
- Interference Electron Microscopy by Means of HolographyJapanese Journal of Applied Physics, 1979