Reliability of Ohmic Contacts for AlGaAs/GaAs HBTs
- 1 January 1990
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Ni, Pd, and Pt on GaAs: A comparative study of interfacial structures, compositions, and reacted film morphologiesJournal of Materials Research, 1987
- Obtaining the specific contact resistance from transmission line model measurementsIEEE Electron Device Letters, 1982
- Models for contacts to planar devicesSolid-State Electronics, 1972