Determination of the optical constants of ZnSe films by spectroscopic ellipsometry
- 1 July 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 76 (1) , 514-517
- https://doi.org/10.1063/1.358484
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Optical properties of ZnSePhysical Review B, 1991
- Molecular beam epitaxial growth and characterization of the dilute magnetic semiconductor Zn1−xFexSeApplied Physics Letters, 1987
- Optical properties and damage analysis of GaAs single crystals partly amorphized by ion implantationJournal of Applied Physics, 1984
- An Ellipsometry System For High Accuracy Metrology Of Thin FilmsPublished by SPIE-Intl Soc Optical Eng ,1984
- Dielectric properties of heavily doped crystalline and amorphous silicon from 1.5 to 6.0 eVPhysical Review B, 1984
- Refractive Index of ZnS, ZnSe, and ZnTe and Its Wavelength and Temperature DerivativesJournal of Physical and Chemical Reference Data, 1984
- Optimizing precision of rotating-analyzer ellipsometersJournal of the Optical Society of America, 1974