New Phase-Sensitive Method of Single-Crystal Characterization under X-Ray Diffraction Conditions
- 13 May 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 76 (20) , 3731-3734
- https://doi.org/10.1103/physrevlett.76.3731
Abstract
A new phase-sensitive method for crystal lattice strain determination is proposed. The phase of the diffracted x-ray wave can be obtained from direct measurements of backscattered intensity. For this purpose we design conditions for creating a standing x-ray wave in a vacuum between two separated crystals. The measurement of the intensity of this wave as a function of the angular position of the crystal makes it possible to uniquely determine the relative phase of the wave scattered by a crystal with a deformed lattice. The experimental setup and some preliminary results are discussed.This publication has 7 references indexed in Scilit:
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