A study of the structural properties of anodized aluminium films
- 1 July 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 81 (3) , 271-278
- https://doi.org/10.1016/0040-6090(81)90489-2
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- The conduction properties of anodic Al2O3 filmsThin Solid Films, 1981
- Fabrication and characteristics of MOS-FET's incorporating anodic aluminum oxide in the gate structureSolid-State Electronics, 1976
- High-quality dielectric suitable for use with amorphous semiconductorsIEEE Journal of Solid-State Circuits, 1974
- Charge-Coupled Devices Fabricated Using Aluminum-Anodized Aluminum-Aluminum Double-Level MetalizationJournal of the Electrochemical Society, 1973
- On the Preparation of Hard Oxide Films with Precisely Controlled Thickness on Evaporated Aluminum Mirrors*Journal of the Optical Society of America, 1949
- The Structure of the electrolytical oxide Layer on AluminiumZeitschrift für Kristallographie - Crystalline Materials, 1935