Active probes for 2-port network analysis within 70-230 GHz
- 1 January 1999
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 4, 1635-1638
- https://doi.org/10.1109/mwsym.1999.780283
Abstract
Active probes for 2-port on-wafer network analysis within 70-230 GHz are presented. The probe contains an integrated circuit based on nonlinear transmission lines (NLTL) which has all elements of an S-parameter test set. 2-port measurements with these active probes were carried out. Compared to earlier act probe systems, measurement accuracy is greatly improvedKeywords
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