The anomalous refractive index in the ellipsometric evaluation of an inhomogeneous film
- 1 June 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 80 (4) , 383-393
- https://doi.org/10.1016/0040-6090(81)90605-2
Abstract
No abstract availableKeywords
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- Ellipsometry of a Transparent Film Overlaid on a Transparent Substrate Having a Surface LayerOptica Acta: International Journal of Optics, 1970
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962