Measurements and analysis of neutron-reaction-induced charges in a silicon surface region
- 1 April 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (2) , 173-178
- https://doi.org/10.1109/23.568799
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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