Transport studies in single-crystal films of CoSi2 and NiSi2; A new class of quasi-two-dimensional metals
- 1 July 1984
- journal article
- Published by Elsevier in Surface Science
- Vol. 142 (1-3) , 37-42
- https://doi.org/10.1016/0039-6028(84)90280-2
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Growth of single crystal epitaxial silicides on silicon by the use of template layersApplied Physics Letters, 1983
- Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiEpitaxial StructuresPhysical Review Letters, 1983
- Epitaxial silicidesThin Solid Films, 1982
- Influence of Spin-Orbit Coupling on Weak LocalizationPhysical Review Letters, 1982
- Two-Dimensional Resistivity of Ultrathin Metal FilmsPhysical Review Letters, 1981
- Two-Dimensional Localization in Thin Copper FilmsPhysical Review Letters, 1981
- Scaling Theory of Localization: Absence of Quantum Diffusion in Two DimensionsPhysical Review Letters, 1979
- Anomalous electrical resistivity and defects incompoundsPhysical Review B, 1977