Hall effect measurements on Sb and Ga implanted silicon; Anneal behavior and comparison with other species
- 1 February 1970
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (2) , 123-130
- https://doi.org/10.1016/0038-1101(70)90042-0
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
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