Characterization of defect growth structrures in ion-plated films by scanning electron microscopy
- 1 November 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 64 (1) , 143-148
- https://doi.org/10.1016/0040-6090(79)90553-4
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Nodular growth in thick-sputtered metallic coatingsJournal of Vacuum Science and Technology, 1974
- Interrelationships between process parameters, structure, and properties of CVD tungsten and tungsten–rhenium alloysJournal of Vacuum Science and Technology, 1974
- The effects of stabilizing additives on the microstructure and properties of electroless copper depositsMetallurgical Transactions, 1974