The PIXE facility at Eindhoven University of Technology
- 1 April 1979
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 8 (2) , 63-64
- https://doi.org/10.1002/xrs.1300080205
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Automatic data acquisition and on-line analysis of trace element concentration in serum samplesNuclear Instruments and Methods, 1978
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- New Uses of Ion AcceleratorsPublished by Springer Nature ,1975
- High Rate X-Ray Fluorescence Analysis by Pulsed ExcitationIEEE Transactions on Nuclear Science, 1972
- The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry — A ReviewPublished by Springer Nature ,1972