Internal Field Emission at NarrowJunctions in Indium Antimonide
- 15 June 1960
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 118 (6) , 1470-1473
- https://doi.org/10.1103/physrev.118.1470
Abstract
An experimental study has been made of the field and temperature dependence of internal field emission in narrow junctions in indium antimonide. Relatively good agreement, both qualitative and quantitative, is obtained between the experimental results and the usual expression for the barrier transparency. From studies of Esaki characteristics at low temperatures and from the observed temperature dependence of the tunnelling current, it is confirmed that the tunnelling transitions do not involve phonons. Also, it is shown that the temperature dependence of the barrier transparency is determined by that of the energy gap at .
Keywords
This publication has 4 references indexed in Scilit:
- Direct Observation of Phonons During Tunneling in Narrow Junction DiodesPhysical Review Letters, 1959
- Electron impact ionization in semiconductorsJournal of Physics and Chemistry of Solids, 1959
- Internal Field Emission in SiliconJunctionsPhysical Review B, 1957
- Hall Effect and Conductivity of InSbPhysical Review B, 1955