Composition mapping at high resolution
- 1 April 1998
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 190 (1-2) , 171-183
- https://doi.org/10.1046/j.1365-2818.1998.3400882.x
Abstract
HRTEM images are traditionally interpreted by comparing experiment and simulation. However, quantitative agreement between experimental and simulated images is rarely achieved. It is thus highly desirable to extract quantitative information from HRTEM lattice images directly, without recourse to simulated images. Such ‘direct’ methods have been used to obtain high‐resolution composition maps from the local information content of HRTEM images. We review the real‐space techniques QUANTITEM and chemical mapping and delineate their application range. Finally, we demonstrate that both methods can be regarded as limiting cases of a more general approach.Keywords
This publication has 44 references indexed in Scilit:
- A simple intuitive theory for electron diffractionUltramicroscopy, 1996
- Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopyUltramicroscopy, 1996
- Quantitative high resolution electron microscopy of III-V compounds: A fuzzy logic approachApplied Physics Letters, 1995
- Quantitative high-resolution transmission electron microscopy of the incoherent Σ3 (211) boundary in CuUltramicroscopy, 1994
- Direct measurement of local lattice distortions in strained layer structures by HREMUltramicroscopy, 1993
- Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopyPhysical Review Letters, 1992
- Quantitative chemical mapping: Spatial resolutionUltramicroscopy, 1992
- Structure retrieval in HREMActa Crystallographica Section A Foundations of Crystallography, 1991
- Tuned voltage in zone-axis diffractionUltramicroscopy, 1990
- Analysis of a complex of statistical variables into principal components.Journal of Educational Psychology, 1933