Depolarization and cross polarization in ellipsometry of rough surfaces
- 15 October 1986
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 25 (20) , 3616-3622
- https://doi.org/10.1364/ao.25.003616
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 5 references indexed in Scilit:
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- Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signalOptics Letters, 1978
- Fourier transform detection system for rotating-analyzer ellipsometersOptics Communications, 1973
- Definitions and conventions in ellipsometrySurface Science, 1969