A semiempirical procedure for the simple calculation of the signal intensity in Pixe analysis of thick samples
- 15 March 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 181 (1-3) , 185-188
- https://doi.org/10.1016/0029-554x(81)90603-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Enhancement correction in high energy particle induced X-ray emission analysisNuclear Instruments and Methods, 1979
- Fitted inner-shell proton ionization cross sections from Ca to Sn for 0.2–2 MeV incident energyNuclear Instruments and Methods, 1979
- Matrix effects in PIXE analysis on liquid samples with an external beamNuclear Instruments and Methods, 1979
- Enhancement in PIXE analysisNuclear Instruments and Methods, 1977
- Die Probleme der Nachweisgrenzen und Empfindlichkeiten von Lanthanoiden mit protoneninduzierter Röntgenspektralanalyse an dicken ProbenAnalytical and Bioanalytical Chemistry, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973