Use of cylindrical Auger spectrometers for retarding-potential secondary-electron yield measurements
- 1 June 1974
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 45 (6) , 861-862
- https://doi.org/10.1063/1.1686757
Abstract
The retarding‐potential method of secondary‐electron yield measurement described previously for use with hemispherical retarding‐grid LEED optics has been extended to use with cylindrical mirror Auger spectrometers. The basic operation of the system was found to be comparable in the two cases, but a serious problem with the design of some electron guns was encountered. This problem could occur with either LEED or Auger spectrometers.This publication has 1 reference indexed in Scilit:
- Fast, Accurate Secondary-Electron Yield Measurements at Low Primary EnergiesReview of Scientific Instruments, 1973