Raman scattering as a compositional probe of II-VI ternary semiconductor nanocrystals
- 8 April 1991
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 58 (14) , 1506-1508
- https://doi.org/10.1063/1.105160
Abstract
We show how Raman optic-mode peak positions and relative intensities can be used in a straightforward way to determine crystallite composition in CdSxSe1−x nanocrystals embedded in glass. These Raman techniques are particularly useful for low-concentration or small-crystallite-size composites where x-ray diffraction is not a viable technique for structural characterization of crystallites.Keywords
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