Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs
- 1 August 1978
- journal article
- Published by Springer Nature in Applied Physics A
- Vol. 16 (4) , 345-352
- https://doi.org/10.1007/bf00885858
Abstract
No abstract availableKeywords
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