Sweep-out Effects in the Phase Shift Method of Carrier Lifetime Measurements
- 1 August 1958
- journal article
- Published by IOP Publishing in Proceedings of the Physical Society
- Vol. 72 (2) , 267-269
- https://doi.org/10.1088/0370-1328/72/2/414
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Direct Reading Minority Carrier Lifetime Measuring ApparatusReview of Scientific Instruments, 1957
- Measurement of Minority Carrier Lifetime and Contact Injection Ratio on Transistor MaterialsProceedings of the Physical Society. Section B, 1954