Data analysis in the optical PoSAP
- 1 March 1996
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 94-95, 457-463
- https://doi.org/10.1016/0169-4332(95)00410-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- The tomographic atom probe: A quantitative three-dimensional nanoanalytical instrument on an atomic scaleReview of Scientific Instruments, 1993
- Implementation of the optical atom probeSurface Science, 1992
- Application of a position-sensitive detector to atom probe microanalysisReview of Scientific Instruments, 1988