An X-ray diffraction investigation of molten copper-indium alloys by the partial interference function method
- 31 October 1972
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 5 (21) , 2985-2990
- https://doi.org/10.1088/0022-3719/5/21/004
Abstract
Total interference functions from alloys of copper with 25.5, 50.0 and 75.0 at% indium have been obtained by X-ray diffraction at 700 degrees C. The assumption of concentration independence of the partial interference functions appears to be valid from the calculation of the partial function between copper and indium, ICuIn(K). For the three alloys, the first peak of ICuIn(K) occurs at 2.85, 2.79 and 2.76AA-1, respectively, with very slight change in general shape. These peak positions are closer to that of pure copper, at 3.00 AA-1, than pure indium, at 2.28AA-1. Thus the alloy behaves in a similar way to those containing groups I and IV elements (eg Au-Sn and Cu-Sn).Keywords
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