The resolution limit for elemental mapping in energy-filtering transmission electron microscopy
- 31 July 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 59 (1-4) , 191-194
- https://doi.org/10.1016/0304-3991(95)00028-y
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Applications of slow-scan CCD cameras in transmission electron microscopyUltramicroscopy, 1993
- Optimum defocus for stem imaging and microanalysisUltramicroscopy, 1987
- A new resolution criterion based on spectral signal-to-noise ratiosUltramicroscopy, 1987