Grain boundary diffusion of in IN Cu along a symmetric 45° tilt boundary

This publication has 9 references indexed in Scilit:

• SIMS analysis of the impurity diffusion of In in Cu
  Philosophical Magazine A, 1983
• Measurement of the impurity diffusion of In in Ni single crystals by secondary-ion mass spectrometry (SIMS)
  Philosophical Magazine A, 1981
• Anwendbarkeit der Sekundärionen-Massenspektrometrie (SIMS) zur quantitativen Untersuchung der Korngrenzenfremddiffusion
  Published by Springer Nature ,1981
• Techniques for the production of oriented bicrystals and results on specimens prepared by these methods
  Acta Metallurgica, 1980
• Diskontinuierliche ausscheidungsreaktionen im system Aluminium-Silber und ihre beeinflussung durch dritte legierungspartner
  Materials Science and Engineering, 1972
• Grain Boundary Impurity Diffusion
  Physica Status Solidi (b), 1966
• The analysis of grain boundary diffusion measurements
  British Journal of Applied Physics, 1963
• Lattice and Grain Boundary Diffusion in Polycrystals
  Transactions of the Japan Institute of Metals, 1961
• CXXXVIII. Concentration contours in grain boundary diffusion
  Journal of Computers in Education, 1954