High-throughput, high-resolution soft X-ray crystal spectrometer for Tokamak-plasma studies
- 1 April 1981
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 14 (4) , 448-452
- https://doi.org/10.1088/0022-3735/14/4/014
Abstract
A Johann-type reflection spectrometer with a wavelength resolution of 15000 at 0.229 nm (CrKalpha ) is described. The diffracting crystal is a (310)-quartz plate with 50*30 mm2 total and useful area, bent to a radius of 1380 mm. The use of a novel, simple crystal bending device and of a position-sensitive proportional counter makes this instrument interesting also for other domains of X-ray spectroscopy. Results of extended calculations on diffraction properties of quartz as a function of diffraction plane index and wavelength are also presented.Keywords
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