Built-in test compiler in an ASIC environment
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 657-664
- https://doi.org/10.1109/test.1988.207849
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Design for testability—A surveyProceedings of the IEEE, 1983
- The Theory of Autonomous Linear Sequential NetworksIRE Transactions on Circuit Theory, 1959