Surface density measurement of pure element thin films by radioisotope x-ray fluorescence spectroscopy
- 1 October 1983
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 12 (4) , 170-172
- https://doi.org/10.1002/xrs.1300120409
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- A comparison of methods for accurate film thickness measurementJournal of Physics E: Scientific Instruments, 1972
- Photon cross sections from 1 keV to 100 MeV for elements Z=1 to Z=100Atomic Data and Nuclear Data Tables, 1970