Theory of spectral line profile analysis with reflection echelon
- 1 April 1971
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 4 (4) , 489-493
- https://doi.org/10.1088/0022-3727/4/4/303
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- A graphic technique for the determination of line-shape parameters using a reflection echelonJournal of Physics D: Applied Physics, 1968
- Tolerance Limits for Surface Errors of Plates for Reflection EchelonOptica Acta: International Journal of Optics, 1967
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- Analytical Description of a Fabry–Perot Photoelectric SpectrometerApplied Optics, 1966
- Radiance Temperature at 6550 Å of the Graphite ArcApplied Optics, 1966
- Birefringence of Natural QuartzApplied Optics, 1966