Triangular Shaped Beam Technique in EB Exposure System EX-7 for ULSI Pattern Formation

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Abstract
The generation of a triangular and rectangular shaped beam is very useful in increasing throughput for writing ULSI patterns which often include many oblique lines. To make use of these shaped beams in ULSI pattern formation, a new rectangular and triangular shaped beam calibration method has been developed on the EB exposure system EX-7. The shaped beam calibration method is established by analyzing the beam current of shaped beams and the backscattered electron signal from a fine gold particle on the target. Resultant accuracies were 0.013 µm for a beam size of 1.6 µm and 0.025 %micro;m for the relative beam position on the target. Using this method, 0.2 µm ULSI patterns including oblique lines have been accurately formed.

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