Scattering and recoiling imaging code (SARIC)
- 1 July 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 114 (3-4) , 371-378
- https://doi.org/10.1016/0168-583x(96)00192-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Composition and structure of the InP{100}- (1 × 1) and -(4 × 2) surfacesSurface Science, 1995
- Time-of-flight scattering and recoiling spectrometry (TOF-SARS) analysis of Pt{110}: I. Quantitative structural study of the clean (1 × 2) surfaceSurface Science, 1991
- Scattering and Recoiling Spectrometry: An Ion's Eye View of Surface StructureScience, 1990
- Experimental realisation of low-energy surface channelingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Time-of-flight scattering and recoiling spectrometer (TOF-SARS) for surface analysisReview of Scientific Instruments, 1990
- Time-of-flight scattering and recoiling spectrometry. I. Structure of the W(211) surfacePhysical Review B, 1989
- Multilayer relaxation for the clean Ni(110) surfacePhysical Review B, 1985
- Computer studies of low energy scattering in crystalline and amorphous targetsNuclear Instruments and Methods, 1976