Stacking faults and microstrain in La1.85M0.15CuO4 (M = Ca, Ba, Sr) by analyzing X-ray diffraction line broadening
- 1 December 1991
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 185-189, 871-872
- https://doi.org/10.1016/0921-4534(91)91659-r
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Direct Observation and Analysis of CuO 2 Shear Defects in La 2-x Sr x CuO 4Science, 1990
- Accurate and rapid reduction of experimental x-ray dataApplied Physics Letters, 1975