A quasi-equilibrium thermally stimulated current process
- 30 April 1977
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 20 (4) , 335-342
- https://doi.org/10.1016/0038-1101(77)90118-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacial trap parametersSolid-State Electronics, 1974
- The evaluation of electron trapping parameters from conductivity glow curves in cadmium sulphideBritish Journal of Applied Physics, 1964
- Thermal Ionization of Trapped ElectronsPhysical Review B, 1952