Structural characterisation of erbium silicide thin films on an Si(111) substrate
- 1 February 1996
- journal article
- Published by Elsevier in Journal of Alloys and Compounds
- Vol. 234 (2) , 244-250
- https://doi.org/10.1016/0925-8388(95)02131-0
Abstract
No abstract availableKeywords
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