Applicability of the Soft X-Ray Standing-Wave Method to Surface Structure Determination

Abstract
The applicability of the soft X-ray standing-wave (SW) method to surface structure determination is discussed by investigating the SW signals of c(2×2)Cl/Ni(100). The measurements of reflectivities for Ni(200) Bragg reflection at nearly normal incidence make it possible to determine the mosaic width (0.3°) of the Ni(100) crystal employed, and the Cl-K fluorescence yield spectrum reveals that Cl atoms are located 0.04Å above the Ni(200) lattice plane. The experimental and analytical error is estimated to be 0.04Å, which allows us to discuss detailed surface structure.