Charge trapping versus buried oxide thickness for SIMOX structures
- 1 December 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 42 (6) , 2114-2121
- https://doi.org/10.1109/23.489261
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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