Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate Optical Constants of Silicon*
- 1 January 1969
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 59 (1) , 64-71
- https://doi.org/10.1364/josa.59.000064
Abstract
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This publication has 10 references indexed in Scilit:
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