STM and AES study of the relation between ion sputter induced roughness and depth resolution
- 31 December 1990
- journal article
- research article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 50 (2) , C9-C13
- https://doi.org/10.1016/0368-2048(90)87079-4
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Sputter depth profiles of Ni/Cr thin-film structures obtained from the emission of Auger electrons and x raysJournal of Vacuum Science and Technology, 1982
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