Effect of Spacer Layer Thickness on Energy Level Width Narrowing in GaInAs/InP Resonant Tunneling Diodes Grown by Organo-Metallic Vapor Phase Epitaxy

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Abstract
We studied the effect of spacer layer thickness on the resonant level width in resonant tunneling diodes (RTDs). GaInAs/InP RTDs were fabricated with various spacer layer thicknesses using organo-metallic vapor phase epitaxy, and the resonant level width was estimated. As a result, the resonant level width was found to decrease with increasing spacer layer thickness. To discuss this tendency, a theoretical model of the interface fluctuation between spacer layers and electrodes, caused by the random distribution of the impurity ions in electrodes, was proposed.